Interface passivation of liquid-phase crystallized silicon on glass studied with high-frequency capacitance-voltage measurements
Phys. Status Solidi A 213, No. 7, 1697–1704 (2016), DOI 10.1002/pssa.201532957
Autor(es):N. Preissler, J. A. Töfflinger, I. Shutsko, O. Gabriel, S. Calnan, B. Stannowski, B. Rech, R. Schlatmann
Año: 2016
Url: http://dx.doi.org/10.1002/pssa.201532957