Impact of the thickness on the optical and electronic and structural properties of sputtered Cu2S thin films
A successful hexagonal Cu 2 S p-type semiconductor thin film using DC magnetron sputtering is reported. Films with thickness gradients were deposited by taking advantage of deposition geometry and target dimensions. X-ray diffraction (XRD) analysis confirmed the exclusive formation of the hexagonal Cu 2 S phase. Elemental composition and thickness dependence with the sample position were determined using energy-dispersive x-ray spectroscopy. Optical properties, including the optical bandgap, refractive index, and extinction coefficient, were assessed by modeling transmittance spectra. The Tauc–Lorentz oscillator and Drude models were employed for this purpose…
Autor(es):Velasquez-Ordoñez, J. R. and Rivera-Taco, J. and Pacheco-Salazar, D. G. and Coaquira, J. A. H. and Maldonado, J. L. and Guerra, J. A. and Llontop, P. and Morais, P. C. and Aragón, F. F. H.
Año: 2024
Título de la revista: Journal of Applied Physics
Volumen: 135
Número: 6
Url: https://doi.org/10.1063/5.0191049